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Andreas gehring dissertation
technischen Wissenschaften eingereicht an der Technischen Universität Wien. NVM devices can be read and programmed like random-access memory (RAM) devices, have a low power consumption, are mechanically robust, and offer medical marijuana in arkansas essay conclusion the possibility of large-scale integration. However, simulation of such devices is often carried out using simplified compact models 269, 270, 271, 272, 273, 274. Finally, a short summary and a comparison of the described methods is given. Wien, im November 2003, the road to wisdom?
5.2 Tunneling in Non-Volatile Memory Devices Dissertation andreas berkefeld - Approved Custom Essay Writing Dissertationen 2018 nach Fächern - bei DuEPublico Schriftenreihe Institut für Abfall- und Kreislaufwirtschaft Uni Trier: Kunstgeschichte - Prof
9525275 geboren. . Different tunneling mechanisms, such as direct-, fowler-nordheim, and trap-assisted tunneling are covered. Gehring: Simulation of Tunneling in Semiconductor Devices.
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The chapter continues with the description of trap-assisted tunneling and discusses some of the most frequently used models. The wentzel-kramers-brillouin- and gundlach-methods, which are frequently encountered in the modeling of tunneling current, are shortly reviewed. The transmission coefficient can be found by a solution of schrÖdinger's equation in the considered region. This model allows to distinguish between the supply function, which describes the supply of carriers for tunneling, and the transmission coefficient, which characterizes the penetrability of the considered energy barrier. Emphasis is put on the adaption of an inelastic trap-assisted tunneling model which incorporates energy loss by phonon emission and does not rely on the common assumptions of constant capture cross-sections. For the case of stacked gate dielectrics or hot electron injection such models do not capture the device physics and can reproduce measured data only on a fit-formula level. The supply function depends on the energetic distribution of the carriers, an important quantity in semiconductor device modeling. Well it's plain and simple to express: Err and err and err again but less and less and less, piet Hein,. Fakultät für Elektrotechnik und Informationstechnik von, andreas Gehring, messerschmidtgasse 2/2/7, a-1180 Wien, Österreich, matr. .
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